Semiconductor inspection is a critical step in ensuring yield and reliability across the integrated circuit manufacturing process.  As core detectors, scientific cameras play a decisive role—their resolution, sensitivity, speed, and reliability directly impact defect detection at the micro- and nanoscale, as well as the stability of inspection systems. To address diverse application needs, we offer a comprehensive camera portfolio, from large-format high-speed scanning to advanced TDI solutions, widely deployed in wafer defect inspection, photoluminescence testing, wafer metrology, and packaging quality control.