2026/09/09Laser systems are becoming increasingly important in semiconductor manufacturing, precision processing, and advanced optical applications. As these processes demand higher accuracy and stability, reliable laser beam characterization has become essential for improving system performance and maintaining process consistency.
Traditional beam measurement methods may face limitations in measurement accuracy, quantitative analysis, and wavelength adaptability, making it difficult to fully evaluate complex laser systems.
To address these challenges, Tucsen introduces the XT Series Beam Analyzer, a high-performance laser beam profiler designed to provide accurate beam characterization across a wide spectral range. Built on Tucsen’s expertise in scientific imaging and photon measurement, the XT Series enables users to capture, analyze, and quantitatively evaluate laser beam information for advanced optical applications.
Broad Spectral Coverage from UV to LWIR
Different laser sources require different measurement solutions. To address diverse application needs, the XT Series adopts a multi-model design covering wavelengths from 240 nm to 14 μm, providing a flexible solution from ultraviolet to long-wave infrared laser measurement.
|
Model |
Spectral Range |
Application Focus |
|
XT105BP |
248 nm, 266 nm UV laser measurement |
Ultraviolet laser systems |
|
XT101BP |
400–1100 nm |
Visible and near-infrared applications |
|
XT102BP |
8–14 μm |
Long-wave infrared laser measurement |
This broad spectral coverage enables the XT Series to support a wide range of laser systems used in semiconductor manufacturing, optical testing, and advanced photonics applications.
Quantitative Beam Analysis with High Measurement Accuracy
As a scientific-grade beam profiler, the XT Series goes beyond basic laser spot imaging. Through calibrated imaging technology and quantitative analysis algorithms, the system provides accurate measurement of beam characteristics rather than simple visual observation.
The XT Series achieves beam width measurement accuracy better than ±2%, enabling more reliable evaluation of laser quality and supporting applications where measurement precision directly impacts system performance.
Based on CMOS imaging technology, the XT Series provides high-quality beam imaging while maintaining the flexibility and integration capability required for industrial and research environments.
Compact Design for Flexible System Integration
Modern semiconductor and optical systems often require measurement solutions that can fit into compact equipment architectures. The XT Series is designed with integration flexibility in mind, with the smallest model measuring only 29 mm × 29 mm × 13.5 mm.
The system supports multiple optical interfaces, GigE data communication, and SDK development, allowing integration into automated inspection equipment, optical calibration systems, and customized measurement platforms.
By combining compact hardware design with flexible software integration, the XT Series helps equipment manufacturers accelerate development and deployment while maintaining reliable laser measurement performance.
Applications of the XT Series Beam Quality Analyzer
The XT Series is designed for applications requiring accurate laser beam characterization and optical system evaluation, including:
● Semiconductor lithography systems
● Semiconductor inspection and metrology equipment
● Precision laser processing systems
● Laser source characterization
● Optical system calibration
From Scientific Imaging to Precision Laser Measurement
The XT Series extends Tucsen’s expertise in scientific imaging into advanced laser beam measurement. By combining high-performance image acquisition, photon response calibration, and intelligent analysis algorithms, the XT Series provides a precise solution for laser beam characterization.
Conclusion
Tucsen brings together decades of scientific imaging experience and advanced photon measurement technology to provide a new approach to laser beam characterization. The XT Series Beam Analyzer provides a reliable solution for precise laser beam characterization across UV to LWIR wavelengths. Combined with Tucsen’s imaging expertise, including EUV camera and sCMOS camera technologies, it enables flexible beam analysis for research and industrial applications.
