Semiconductor inspection o se laasaga taua i le faʻamautinoaina o fua ma faʻamaoni i luga o le faʻagasologa o gaosiga faʻatasi. I le avea ai ma su'esu'ega autu, o mea pu'eata fa'asaienisi e fai se sao taua-o latou fofo, maaleale, saoasaoa, ma le fa'amaoni e a'afia sa'o ai le su'esu'eina o faaletonu i le micro- ma nanoscale, fa'apea fo'i ma le mautu o faiga su'esu'e. Ina ia faʻatalanoaina manaʻoga eseese, matou te ofoina atu se faʻapipiʻi atoatoa meapueata, mai le tele-faʻasologa maualuga-saosaoa suʻesuʻega i fofo TDI alualu i luma, lautele faʻapipiʻiina i suʻesuʻega faʻaletonu, photoluminescence suʻega, wafer metrology, ma le faʻatonutonuina lelei o afifi.
Va'aiga Va'aiga: 180–1100 nm
QE masani: 63.9% @ 266 nm
Max. Fua o Laina: 1 MHz @ 8 / 10 bit
TDI Vaega: 256
Fa'amatalaga Fa'amatalaga: 100G / 40G CoF
Metotia malulu: Ea / Suavai
Va'aiga Va'aiga: 180–1100 nm
QE masani: 50% @ 266 nm
Max. Fua o Laina: 600 kHz @ 8 / 10 bit
TDI Vaega: 256
Fa'amatalaga Fa'amatalaga: QSFP+
Metotia malulu: Ea / Suavai
Va'aiga Va'aiga: 180–1100 nm
QE masani: 38% @ 266 nm
Max. Fua o Laina: 510 kHz @ 8 bit
TDI Vaega: 256
Fa'amatalaga Fa'amatalaga: CoaXPress 2.0
Metotia malulu: Ea / Suavai