Semiconductor inspection inhanho yakakosha mukuona goho uye kuvimbika mukati memubatanidzwa wedunhu rekugadzira maitiro. Sema core detectors, makamera esainzi anoita basa rakasimba — kugadzirisa kwawo, kunzwa, kumhanya, uye kuvimbika kunokanganisa kutariswa kwehurema pamicro- uye nanoscale, pamwe nekugadzikana kwemasystem ekuongorora. Kugadzirisa zvakasiyana-siyana zvekushandisa, isu tinopa yakazara kamera portfolio, kubva kuhombe-fomati yepamusoro-yekumhanyisa scanning kusvika kune yepamusoro TDI mhinduro, yakashandiswa zvakanyanya muwafer defect yekuongorora, photoluminescence kuyedza, wafer metrology, uye kurongedza kwemhando yekudzora.
Spectral Range: 180-1100 nm
Yakajairika QE: 63.9% @ 266 nm
Max. Line Rate: 1 MHz @ 8 / 10 bit
TDI Danho: 256
Data Interface: 100G / 40G CoF
Kutonhora nzira: Mhepo / Liquid
Spectral Range: 180-1100 nm
Yakajairika QE: 50% @ 266 nm
Max. Line Rate: 600 kHz @ 8 / 10 bit
TDI Danho: 256
Data Interface: QSFP+
Kutonhora nzira: Mhepo / Liquid
Spectral Range: 180-1100 nm
Yakajairika QE: 38% @ 266 nm
Max. Line Rate: 510 kHz @ 8 bit
TDI Danho: 256
Data Interface: CoaXPress 2.0
Kutonhora nzira: Mhepo / Liquid