Ukuhlolwa kweSemiconductor linyathelo elibalulekileyo ekuqinisekiseni isivuno kunye nokuthembeka kuyo yonke inkqubo yokwenziwa kwesekethe edibeneyo. Njengee-detectors eziphambili, iikhamera zenzululwazi zidlala indima ecacileyo-isisombululo sabo, uvakalelo, isantya, kunye nokuthembeka ngokuthe ngqo kuchaphazela ukufunyanwa kwesiphako kwi-micro- kunye ne-nanoscale, kunye nokuzinza kweenkqubo zokuhlola. Ukujongana neemfuno zezicelo ezahlukeneyo, sibonelela ngephothifoliyo yekhamera ebanzi, ukusuka kwifomathi enkulu enesantya esiphezulu ukuya kwizisombululo ze-TDI, ezisasazwe ngokubanzi kuhlolo lwesiphene se-wafer, uvavanyo lwe-photoluminescence, i-wafer metrology, kunye nolawulo lomgangatho wokupakishwa.
Uluhlu lweSpectral: 180-1100 nm
QE eqhelekileyo: 63.9% @ 266 nm
Max. Ireyithi yomgca: 1 MHz @ 8 / 10 bit
Inqanaba le-TDI: 256
Ujongano lweDatha: 100G / 40G CoF
Indlela yokupholisa: Umoya / ulwelo
Uluhlu lweSpectral: 180-1100 nm
QE eqhelekileyo: 50% @ 266 nm
Max. Ireyithi yomgca: 600 kHz @ 8 / 10 bit
Inqanaba le-TDI: 256
Data Interface: QSFP+
Indlela yokupholisa: Umoya / ulwelo
Uluhlu lweSpectral: 180-1100 nm
QE eqhelekileyo: 38% @ 266 nm
Max. Ireyithi yomgca: 510 kHz @ 8 bit
Inqanaba le-TDI: 256
Ujongano lweDatha: CoaXPress 2.0
Indlela yokupholisa: Umoya / ulwelo